Low-noise CMOS image sensors towards single-photon detection

نویسندگان

  • Min-Woong Seo
  • Keiichiro Kagawa
  • Keita Yasutomi
  • Shoji Kawahito
چکیده

A deep sub-electron read noise and high conversion gain CMOS image sensor using reset-gate-less pixel has been developed and demonstrated for the first time at photoelectron-counting-level imaging. The developed CIS based on a multiple sampling technique has a high conversion gain of 220μV/eand a low read noise of 0.27e-rms.

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تاریخ انتشار 2016